Description

Probe kits offer substantial cost savings and added convenience. NIST traceable certificates are included.

• TFP-01: IEC Jointed Finger Probe w/ banana jack in handle (as required)
• CTF-01: Child Test Finger Probe / Probe 19 of IEC 61032
• CTF-02: Child Test Finger Probe / Probe 18 of IEC 61032
• TPP-01: Test Pin Probe (short)
• TPP-03: Test Pin Probe
• TRP-02: 1.0mm Test Wire Probe / Test Probe D of IEC 61032
• TRP-01: 2.5mm Test Rod Probe / Test Probe C of IEC 61032
• UFP-01: Rigid Finger Probe
• TH-01: IEC Test Hook (with means for connection to force gauge)
• ITB-01: 50mm impact test ball w/ removable eyelet (as required)
• ITB-04: Impact Test Ball w/ Rockwell Hardness R62+ (as required)
• TTP-01: Telecom Test Probe (to test accessibility to TNV circuits)
• CC-04: Two padded carrying cases
• NIST-traceable Certificates of Calibration (measurement data sold separately)