Probe kits offer substantial cost savings and added convenience. NIST traceable certificates are included.

  • TFP-01: IEC Jointed Finger Probe w/ banana jack in handle (as required)
  • CTF-01: Child Test Finger Probe / Probe 19 of IEC 61032
  • CTF-02: Child Test Finger Probe / Probe 18 of IEC 61032
  • TPP-01: Test Pin Probe (short)
  • TPP-03: Test Pin Probe
  • TRP-02: 1.0mm Test Wire Probe / Test Probe D of IEC 61032
  • TRP-01: 2.5mm Test Rod Probe / Test Probe C of IEC 61032
  • UFP-01: Rigid Finger Probe
  • TH-01: IEC Test Hook (with means for connection to force gauge)
  • ITB-01: 50mm impact test ball w/ removable eyelet (as required)
  • ITB-04: Impact Test Ball w/ Rockwell Hardness R62+ (as required)
  • TTP-01: Telecom Test Probe (to test accessibility to TNV circuits)
  • CC-04: Two padded carrying cases
  • NIST-traceable Certificates of Calibration (measurement data sold separately)