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TFP-01 Jointed Finger Probe






Product Details

This is the "international" test finger required by most IEC, EN and CSA standards, in addition to many UL standards. The Jointed Finger Probe is a high-precision probe built in exact accordance with IEC standards such as IEC 60950, IEC 61010, and is also used for CSA and UL standards. It features a palm simulator to prevent misuse, and restricted joint movement which simulates human finger movement. The finger is made of chrome-plated steel and the rest of the instrument is Delrin®.

This is the ONLY Finger Probe available with a integral jack in the handle for continuity testing - as mandated by the IECEE CB Scheme.
IEC61032-Probe B-Figure 2