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Accesibility Probes

Available with IEC/ISO 17025 Certificate of Calibration
FOR TESTING THE PROTECTION AGAINST ACCESS TO HAZARDOUS PARTS

Our complete line of accessibility probes will allow you to determine compliance with all IEC, EN, UL, CE, CSA and other international safety Standards. ED&D offers the highest quality test probes available in the world.
These probes are used to determine if accessibility exists with fingers, tools, and foreign objects to hazardous areas [involving shock hazards (voltage), energy hazards (VA) and injury hazards (i.e. moving parts)]. If you can’t tell which probe is right for your products, send us a copy of the specifications from the safety standard you are using. We can provide custom probes to meet your needs. All probe bodies are machined from high quality Delrin® (extremely resistant to deformation). ISO/IEC 17025 Accredited and NIST-traceable Certificates of Calibration available! Measurement and Uncertainty data available.

All ED&D Probes are Made in the USA.
TPK Probe Kits™
Several different accessibility probe kits are available for specific standards. Kits can be created for other standards on request.

Probe Kits offer substantial cost savings, not to mention added convenience and portability!
Model IEC / EN UL CSA
TPK-01 60950 60950 950
TPK-02 60601 2601 601
TPK-03 61010    
TPK-04 60335    
TPK-05 60529    
TPK-06 60065 6500  
TPK-01 Test Probe Kit™
above: Probe Kit ready-to-ship in custom-cut foam padded carrying case
Product Details

The TPK-01 contains the devices listed in the core of the UL / IEC / EN 60950 requirements. It includes the following:
  • IEC Jointed Finger Probe (w/ banana jack in handle) (TFP-01)
  • 50mm Impact Test Ball (ITB-01)
  • Test Pin Probe: short (TPP-01)
  • Rigid Finger Probe (UFP-02)
  • Ball Pressure Tester (BPT-01)
  • Telecom Test Probe (TTP-01)

Also includes: custom-cut foam padded carrying case and ISO 17025 accredited Certificate of Calibration - - with specific Scope for “Accessibility Probes”!
TPK-02 Test Probe Kit™
above: Probe Kit ready-to-ship in custom-cut foam padded carrying case
Product Details

The TPK-02 contains the devices listed in the core of the UL / IEC / EN 60601 requirements. It includes the following:
  • IEC Jointed Finger Probe (w/ banana jack in handle) (TFP-01)
  • Impact Test Ball (ITB-01)
  • Test Pin Probe: short (TPP-01)
  • Rigid Finger Probe (UFP-02)
  • Ball Pressure Tester (BPT-01)
  • Test Hook (TH-01)
  • 4.0 mm Hazardous Live Parts Probe (HLP-01)

Also includes: custom-cut foam padded carrying case and ISO 17025 accredited Certificate of Calibration - - with specific Scope for “Accessibility Probes”!
TPK-03 Test Probe Kit™
above: Probe Kit ready-to-ship in custom-cut foam padded carrying case
Product Details

Several Different accessibility probe kits are available for specific standards. Kits can be created for other standards on request. Probe Kits offer substantial cost savings not to mention added convenience.

The TPK-03 contains the devices listed in the core of the UL / IEC / EN 61010 requirements. It includes the following:
  • IEC Jointed Finger Probe (w/ banana jack in handle) (TFP-01)
  • Test Pin Probe: short (TPP-01)
  • Hazardous Live Parts Probe (HLP-01)
  • Rigid Finger Probe (UFP-02)
  • Preset Controls Probe (PCP-01)
  • Ball Pressure Tester (BPT-01)

Also includes: custom-cut foam padded carrying case and NIST-traceable IEC/ISO 17025 accredited Certificate of Calibration - - with specific Scope for “Accessibility Probes”! Uncertainty measurement data is available separately.
TPK-04 Test Probe Kit™
above: Probe Kit ready-to-ship in custom-cut foam padded carrying case
Product Details

The TPK-04 contains the devices listed in the core of the UL / IEC / EN 60335 requirements. It includes the following:
  • IEC Jointed Finger Probe (w/ banana jack in handle) (TFP-01)
  • Test Pin Probe: short (TPP-01)
  • Test Pin Probe: long 50mm (TPP-04)
  • Rigid Finger Probe (UFP-02)
  • Test Thorn Probe (THN-01)
  • Ball Pressure Tester (BPT-01)

Also includes: custom-cut foam padded carrying case and NIST-traceable IEC/ISO 17025 accredited Certificate of Calibration - - with specific Scope for “Accessibility Probes”! Uncertainty measurement data is available separately.
TPK-05 Test Probe Kit™
above: Probe Kit ready-to-ship in custom-cut foam padded carrying case
Product Details

The TPK-05 was designed to provide the probes required by UL / IEC / EN 60529, the IP Code standard. It includes the following:
  • IEC Jointed Finger Probe (w/ banana jack in handle) (TFP-01)
  • 2.5 mm Test Rod (TRP-01)
  • 1.0 mm Test Wire (TRP-02)
  • Test Sphere Probe with handle (TSP-01)
  • Test Sphere Probe (small) (TSP-02)
  • NIST-traceable Certificate included. ISO/IEC 17025 Accredited Calibration with Data available for an additional fee. We are "in scope" and it specifically lists us for "Accessibility Probes"! (data is available separately)
  • Custom-cut padded carrying case
  • One year warranty
  • Free expert level technical support

above: Probe Kit ready-to-ship in custom-cut foam padded carrying case
Product Details

Probe kits offer substantial cost savings and added convenience. NIST traceable certificates are included.
  • TFP-01: IEC Jointed Finger Probe w/ banana jack in handle (as required)
  • CTF-01: Child Test Finger Probe / Probe 19 of IEC 61032
  • CTF-02: Child Test Finger Probe / Probe 18 of IEC 61032
  • TPP-01: Test Pin Probe (short)
  • TPP-03: Test Pin Probe
  • TRP-02: 1.0mm Test Wire Probe / Test Probe D of IEC 61032
  • TRP-01: 2.5mm Test Rod Probe / Test Probe C of IEC 61032
  • UFP-01: Rigid Finger Probe
  • TH-01: IEC Test Hook (with means for connection to force gauge)
  • ITB-01: 50mm impact test ball w/ removable eyelet (as required)
  • ITB-04: Impact Test Ball w/ Rockwell Hardness R62+ (as required)
  • TTP-01: Telecom Test Probe (to test accessibility to TNV circuits)
  • CC-04: Two padded carrying cases
  • NIST-traceable Certificates of Calibration (measurement data sold separately)

TPP-01 Short Test Pin Probe
Product Details

The model TPP-01 short Test Pin Probe is used to test for accessibility of small objects and meets IEC, CSA and UL requirements. The probe is made of stainless steel with a Delrin® handle. Meets IEC 60950 and 61032, as well as other national and international standards. All ED&D probes come with NIST traceable certificates of calibration. There is an additional fee for the data, and it must be ordered in advance. ED&D utilizes ISO/IEC 17025 quality systems, and operates a full calibration lab.
IEC61032-Probe 13-Figure 9
TPP-02 Long Test Pin Probe
Product Details

This pin is used on appliances for verifying that there is no access to hazardous live parts of heating elements which could be touched accidentally by a tool (i.e. screwdriver). Also for testing parts supporting such elements. Meets IEC, EN, CE, VDE, UL & CSA requirements. Body is Delrin®, tip is stainless steel. Unit comes with NIST traceable certificate and cases are avaiable.
TPP-03 Test Pin Probe
Product Details

Test Pin Probe for IEC 60665.
TPP-04 Long Test Pin Probe
Product Details

This product complies with all IEC, EN, CE, VDE, UL and CSA requirements. This is a high-precision, stainless steel device with a Delrin® handle and stop. The unit comes with NIST traceable certificate and calibration. NIST traceable measurement data is available at a nominal charge. ISO 17025 accredited calibration is available, but additional charges apply. Case is available at a nominal charge.
IEC61032-Probe 12-Figure 8
TRP-01 2.5mm Test Rod
Product Details

Used to verify the protection of persons against access to hazardous parts. Also used to verify the protection against access with a tool. Meets IEC and EN Standards including IEC 60529 and IP3 and suffix C codes. The handle and stop face are made of Delrin®. The rod is made of stainless steel.
IEC61032-Probe C-Figure 3
TRP-02 1.0mm Test Rod
Product Details

Used to verify the protection of persons against access to hazardous parts. Also used to verify the protection against access with a tool. Meets IEC and EN Standards including IEC 60529 for IP4 and suffix D codes. The handle and stop face are made of Delrin®. The rod is made of stainless steel.
IEC61032-Probe D-Figure 4
TRP-04 Test Rod Probe from IEC61032 (#31 fig. 14)
Product Details

The Test Rod Probe model TRP-04 is shown in IEC 61032, Figure 14 - Test Probe 31 - probes specifically intended to verify the protection of persons against access to hazardous mechanical parts.

TRP-05 Test Rod Probe
Product Details

Unit includes ISO/IEC 17025 Accredited Certificate of Calibration [IN SCOPE + NIST-traceable - - ED&D exclusive!], also includes 1-year warranty. Packaging, Shipping and Handling also included in the price!
IEC61032-Probe 32-Figure 15
TRP-06 1/16 in. UL Test Rod Probe
Product Details

1/16th inch diameter rod probe with hemispherical end.
TW-01 Test Wire
Product Details

Used to verify the protection of persons against access to hazardous live parts of electrical toys. Also used to verify the protection against access with a tool. Meets IEC and EN Standards including IEC 60529 for IP3 and suffix C codes. The handle and stop face are made of Delrin®. The wire is made of stainless steel.
IEC61032-Probe 17-Figure 11
PCP-01 Preset Controls Probe
Product Details

Used to verify protection against access to hazardous parts by use of a tool through holes which give access to pre-set controls. Meets IEC, EN, UL and CSA Standards including IEC 1010, EN 61010-1, U- 3101-1, UL 3111-1 and CSA 1010-1. The handle and stop face are made of Delrin®. The rod is stainless steel.
HLP-01 Hazardous Live Parts Probe
Product Details

Used to verify protection against access to hazardous parts through top openings. Meets IEC, EN, UL and CSA Standards including IEC 1010, EN61010-1, UL3101-1, and CSA 1010-1. The handle and stop face are made of Delrin®. The rod is made of stainless steel.
TFP-01 Jointed Finger Probe
Product Details

This is the "international" test finger required by most IEC, EN and CSA standards, in addition to many UL standards. The Jointed Finger Probe is a high-precision probe built in exact accordance with IEC standards such as IEC 60950, IEC 61010, and is also used for CSA and UL standards. It features a palm simulator to prevent misuse, and restricted joint movement which simulates human finger movement. The finger is made of chrome-plated steel and the rest of the instrument is Delrin®.

This is the ONLY Finger Probe available with a integral jack in the handle for continuity testing - as mandated by the IECEE CB Scheme.
IEC61032-Probe B-Figure 2
TFP-03 Jointed Finger Probe for Blenders
Product Details

This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger. For blenders, it has a circular stop face with a diameter of 125 mm, the distance between the tip of the test finger and the stop face being 100 mm.
TFP-04 Articulating Finger Probe
Product Details

IEC articulating finger probe having a circular stop face with a diameter of 50 mm, instead of the non-circular face. Unit includes ISO/IEC 17025 Accredited Certificate of Calibration [IN SCOPE + NIST-traceable - - ED&D exclusive!], also includes 1-year warranty. Packaging, packing and Handling also included in the price!
TFP-1089 Jointed Finger Probe
Product Details

This probe is precision made of Delrin® and flash chrome plated steel. It differs from the IEC and UL standard probe because the jointed finger is 10mm longer and there is no simulated palm. The rest of the dimensions are in accordance with IEC and UL standards. A special disk for the metal finger is also required by GR-1089 requirements. Both the disk and the finger are certified to meet the GR-1089 requirements. The unit includes a banana jack in the handle to check continuity, as required. This product includes certificate of calibration.
LVI-01 Electrical Contact Indicator
Product Details

IMPORTANT: This product is used with TFP-01 as an accessory.
This unit is required in many standards. It is used to determine if probe is able to make electrical contact within product under test. The Test Finger must be purchased seperately! With transformer 230V/42V 25mA 50-60Hz. With pilot lamp 36-45V/2W, with 2 connecting leads and with 2 tapping clips. Meets standards according to IEC 60529, IEC 60598, EN 60335 and others. Other Voltages, etc are available by request.
UFP-01 Rigid Finger Probe
Product Details

The Un-jointed/rigid Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe would be a hindrance. The UFP-01 meets IEC 60950 and 61010, CSA and UL requirements. This probe is precision made of flash chrome plated steel and the rest of the instrument of Delrin®. The handle can be threaded for use with our digital force gauges. All ED&D probes come with NIST traceable certificates of calibration. There is an additional fee for the data, and it must be ordered in advance. ED&D operates an ISO/IEC 17025 calibration lab.
IEC61032-Probe 11-Figure 7
UFP-02 Rigid Finger Probe
Product Details

Precision Made of Stainless Steel with Delrin® handle and includes ISO 17025 accredited calibration certificate.
ULP-01 UL Finger Probe
Product Details

This is the UL test finger, researched and designed by UL and required by most UL Standards. Palm simulator and restricted joint movement simulates human finger movement. Made of all nylon.
ITC-01 IEC Test Chain
Product Details

Built in exact accordance with the IEC specifications: “This chain is intended to verify the inaccessibility of hazardous live operating shafts of the controls of domestic sound and vision equipment and their fixing screws.” Unit includes NISTtraceable certificate of calibration.
THN-01 Test Thorn Probe
Product Details

This probe is for testing accessibility in appliances with visibly glowing heating elements. Also for testing parts supporting such elements. Complies with IEC, EN, UL & CSA requirements. Made entirely of stainless steel. Unit is NIST traceable, measurement data is available at a nominal charge and cases are available.
IEC61032-Probe 41-Figure 16
TSP-01 Test Sphere Probe
Product Details

This probe is intended to verify protection of persons against access to hazardous parts for an IP1 Code. Also used to verify protection from access with the back of the hand for an IP suffix A code.
IEC61032-Probe A-Figure 1
TSP-02 Test Sphere Probe
Product Details

This sphere is intended to verify the degree of protection of enclosures for an IP2 Code per IEC 529. Sphere is hardened steel with chrome finish.
IEC61032-Probe 2-Figure 6
RTR-01 Rigidity Test Rod Probe
Product Details

For testing enclosure rigidity in accordance with clause 8.1 of IEC 1010 and the EN, UL and CSA versions of this Standard. Handle is Delrin®, tip is stainless steel.
TUP-01 Uninsulated Live Parts Probe
Product Details

For testing accessibility in accordance with many UL Standards. The handle is Delrin® and the tip is stainless steel. NIST tracealbe certificate is included.
CP-01 Coin Probe
Product Details

Four probes in one! Used to determine accessibility to shock hazards in many household and audio/video products, including Standards UL 1410 and UL 6500. Made entirely of nickel-plated steel.
EWP-01 Enameled Wire Probe
Product Details

For testing accessibility in accordance with many UL Standards. In many standards, this probe is used for access to enamel coated wire (i.e. transformers and inductors). The handle is Delrin® and the tip is stainless steel.
TH-01 Test Hook Probe
Product Details

Used on enclosures prior to accessibility testing. The test hook is hooked into vents and seams in the enclosure and then pulled with a force (usually 20N). The hook has a hole at its long end, for use in conjunction with a PFI series Force Gauge. Made entirely of stainless steel.
FBC-639 Metal Cylinder Probe
Product Details

Designed for testing against ingress of small rodents.
HMP-01 Hazardous Moving Parts Probe
Product Details

For testing accessibility to hazardous moving parts such as access to fan blades through a fan finger guard. Complies with UL Standards. Made entirely of stainless steel, weighs 1 lb.
CTF Jointed Child Finger Probes
Product Details

Shown are the CTF-01 and CTF-02 probes.
Model CTF-01 is for simulation of 0-36 month old children (IEC61032-Probe 19-Figure 13); Model CTF-02 is for simulation of children ages 3-14 years (IEC61032-Probe 18-Figure 12). These sized test fingers are to test for protection againt access to hazardous parts with a human finger and/or arm. These are high precision probes made in exact accordance with IEC.
FNP-01 Fingernail Probe
Product Details

The Finger Nail Test Probe is used to test IEC 60335 and UL standards. It checks the security of parts that snap together. The spring loading in the handle can be calibrated to the force necessary to use the instrument. This probe is made of stainless steel with specially hardened tip and Delrin® handle.
BEP-01 Blunt End Probe
Product Details

Stainless steel probe required by various UL, CSA, IEC, and EN standards.
TTP-01 Telecom Test Probe
Product Details

The Telecom Access Probe is required in IEC 60950,IEC 60065, UL and CSA Standards. It is used to check for limited access to telecommunications voltages (TNV), mainly telephone jacks and operator areas. Satisfies basic standard for telecom product safety.
AWP-01 Wedge Probe
Product Details

This product is used for testing access to document shredders. The Jointed Accessibility Wedge Probe is a high precision probe made in exact accordance with UL and CSA standards such as UL 60950 and for paper document shredders.

The AWP-01 is made of solid aluminum to conserve weight yet maintain rigidity. Others maintain that the tip needs to be more rigid, because of the cutting blades. This underscores their lack of knowledge of the requirements as you do not perform the test with the unit energized! No damage can occur to the probe unless the shredder is energized - - in which case there is extreme danger in performing the test! The Shredder Accessibility Probe is intended for testing paper shredders in accordance with Annex NAF of the Standard for Information Technology Equipment, UL60950-1:2006 and CSA60950-1-03.
ULP-200 Articulated / Metal UL Finger Probe
Product Details

The ED&D UL Articulated Finger Probe is a standard articulated finger as required by Underwriters Laboratories (UL) in many of their standards. This exclusive new design is high-precision machined of aluminum with a stainless steel tip. It is extremely durable and is provided with continuity provision to the tip. Unit comes with NIST traceable and ISO/IEC 17025 accredited certificate of calibration.
MTC Test Cone
Product Details

We offer two test cones, the Model MTC-01 and the Model MTC-02. MTC-01 is 60 mm in diameter for IEC60601-2-38, Clause 23.101 and MTC-02 is 120 mm in diameter for IEC60601-2-38, Clause 23.101. These cones are made of Anodized Aluminum.
TBP-33 Test Bar Probes
Product Details

Unit includes ISO/IEC 17025 Accredited Certificate of Calibration [IN SCOPE + NIST-traceable - - ED&D exclusive!], also includes 1-year warranty. Packaging, packing and Handling also included in the price!
TB-01 and TB-02 Test Bar Probes
Product Details

Unit includes ISO/IEC 17025 Accredited Certificate of Calibration [IN SCOPE + NIST-traceable - - ED&D exclusive!], also includes 1-year warranty. Packaging, packing and Handling also included in the price!
TB-42 Test Bar Probes
Product Details

Unit includes ISO/IEC 17025 Accredited Certificate of Calibration [IN SCOPE + NIST-traceable - - ED&D exclusive!], also includes 1-year warranty. Packaging, packing and Handling also included in the price!
RAP-01 Rubber Accessibility Probe Kit
Product Details

The rubber accessibility probe is intended for testing accessibility on modular jacks per Section 20 of the Standard for Communications-Circuit Accessories, UL1863:2004. This probe meets the specifications as shown in Fig. 20.1. This probe is provided as a “set” of 5 identical probes as the probes can be damaged during use due to the soft rubber material being inserted into potentially sharp modular jacks. Damaged probes should be discarded – only undamaged probes should be used to insure reliable test results.
HBP-102 & HBP-103 Blender Probes
Product Details

HBP: 102 Blender Probe meets IEC 60335-2-14, Clause 20.102; Stainless Steel Rod has a diameter of 8.0 mm x 80 mm long; Delrin® Handle is 25.5 mm diameter and 105 mm long.

HBP:103 Blender Probe meets IEC 60335-2-14, Clause 20.103; Stainless Steel Rod has a diameter of 40 mm with a and a hemispherical end at 120 mm length; Delrin® handle is 25 mm diameter and 100 mm long.
EWT-01 Entrapment Wedge Tool
Product Details

Used for assessing the risk of neck entrapment in v-shaped openings in medical beds. The EWT-01 is precisely manufactured of polished aluminum, and is compliant with the medical electrical equipment standard IEC 60601-2-52, Annex CC, Figure CC.1.
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